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  • Progress in Transmission Electron Microscopy 1

  • Herausgegeben:Zhang, Xiao-Feng; Zhang, Ze
  • Gebunden,
  • Springer, Berlin
  • (2001)
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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and in ...

DETAILS

  • Progress in Transmission Electron Microscopy 1
  • Gebunden, xvi, 367 S.
  • XVI, 367 p.
  • Sprache: Englisch
  • 235 mm
  • ISBN-13: 978-3-540-67680-5
  • Titelnr.: 09276751
  • Gewicht: 698 g
  • Springer, Berlin (2001)
  • Herstelleradresse

    Springer Heidelberg

    Tiergartenstr. 17

    69121 - DE Heidelberg

    E-Mail: buchhandel-buch@springer.com

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